Name: | CHROMIUM |
CAS: | 7789-02-8 ;7440-47-3 |
Synonyms: | CHROMIUM, OIL BASED STANDARD ; CHROMIUM SINGLE ELEMENT STANDARD ; CHROMIUM, ANALYTICAL STANDARD ; CHROMIUM STANDARD ; CHROMIUM AA STANDARD ; CHROMIUM ; CHROMIUM IN XYLENE ; CHROME ; CHROMIUM METAL ; ELECTROLYTIC CHROMIUM ; CHROMIUM AA SINGLE ELEMENT STANDARD ; CHROMIUM III SPECIATION SINGLE ; YEAST BOUND CHROMIUM ; CHROMIUM(III) NITRATE NONAHYDRATE, 99% ; CHROMIUM PLASMA STANDARD ; CHROMIUM IN HYDROCARBON OIL ; CHROMIUM ICP STANDARD ; CHROMIUM SOLUTION ; CHROMIUM ATOMIC ABSORPTION STANDARD ; CHROMIUM SINGLE ELEMENT PLASMA STANDARD ; QUILON(R) L CHROMIUM COMPLEX ; CHROMIUM VI SPECIATION SINGLE ; AQUANAL(TM)-PLUS CHROMIUM |
MDL.: | MFCD00010944 |
H bond acceptor: | 0 |
H bond donor: | 0 |
Smile: | [Cr] |
InChi: | InChI=1S/Cr |
InChiKey: | InChIKey=VYZAMTAEIAYCRO-UHFFFAOYSA-N |
Property |
|
Melting Point: | 1857 DEG C(LIT)/1890℃ |
Boiling Point: | 2672 DEG C(LIT)/2480℃ |
Density: | 7.14g/mLat25°C(lit.) |
Physical Property: | RESISTIVITY: 12.7 MUOMEGA-CM 20 DEG C |
Comments: | APPLICATION: SPUTTERING IS A PROCESS WHEReBY ATOMS ARE EJECTED FROM A SOLID TARGET MATERIAL DUE TO BOMBARDMENT OF THE TARGET BY ENERGETIC PARTICLES. IT IS COMMONLY USED FOR THIN-FILM DEPOSITION, ETCHING AND ANALYTICAL TECHNIQUES ASSAY METHOD: TRACE METALS BASIS DIAM X THICKNESS: 3.00 IN X 0.125 IN WGK: 3 |
Safety information |
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Symbol: |
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Signal word: | Warning |
Hazard statements: | H400 |
Precautionary statements: | P273 |
Safe Code: | S:S24/25 |
WGK Germany: | 3 |
CHROMIUM
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